Complementary SEM-EDS / FIB-SEM Sample Preparation Techniques for Atom Probe Tomography of nanophase-Fe0 in Apollo 16 Regolith Sample 61501,22
نویسندگان
چکیده
منابع مشابه
Focused ion beam sample preparation for atom probe tomography
Atom Probe (AP) tomography is maturing into a routine method for the atomic resolution compositional analysis of metals, semiconductors and some polymers. This is often combined with a Transmission Electron Microscope (TEM) analysis of the same region of interest. The Focused Ion Beam (FIB) microscope has evolved as an essential tool for site and orientation specific sample preparation for such...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2019
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192761901345x